This summary presents an in‐depth overview of thin films and the analysis of their surface morphology. Thin films, defined as material layers with thicknesses ranging from nanometres to micrometres, ...

Surface roughness is referred to as a series of microscopic geometric features of tiny valleys and peaks of different spacings and heights that are typically arranged in a non-deterministic way on a ...

AFM differs significantly from traditional microscopy techniques as it does not project light or electrons on the sample's surface to create its image. Instead, AFM utilizes a sharp probe while ...